The Film Thickness Effect on Electrical Conduction Mechanisms and Characteristics of the Ni-Cr Thin Film Resistor
Chuang, Nai-Chuan, Lin, Jyi-Tsong, Chang, Ting-Chang, Tsai, Tsung-Ming, Chang, Kuan-Chang, Wu, Chih-WeiYear:
2016
Language:
english
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/JEDS.2016.2598189
File:
PDF, 540 KB
english, 2016