![](/img/cover-not-exists.png)
[IEEE 2016 Optoelectronics Global Conference (OGC) - Shenzhen, China (2016.9.5-2016.9.7)] 2016 IEEE Optoelectronics Global Conference (OGC) - Development status and aberration overview of micro spectrometer with Czerny-Turner structure
Yan, An, Zhenye, Wang, Tao, Zhu, Keyan, Dong, Xinhang, LiYear:
2016
Language:
english
DOI:
10.1109/OGC.2016.7590479
File:
PDF, 371 KB
english, 2016