Catastrophic degradation of InGaN/GaN blue laser diodes

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IEEE Transactions on Device and Materials Reliability 2016

Catastrophic degradation of InGaN/GaN blue laser diodes

Wen, Pengyan, Zhang, Shuming, Liu, Jianping, Li, Deyao, Zhang, Liqun, Zhou, Kun, Su, Xujun, Tian, Aiqin, Zhang, Feng, Yang, Hui
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Year:
2016
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2016.2617885
File:
PDF, 534 KB
english, 2016
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