Single Pulse Avalanche Mode Robustness of Commercial 1200 V...

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IEEE Transactions on Power Electronics 2016

Single Pulse Avalanche Mode Robustness of Commercial 1200 V / 80 mΩ SiC MOSFETs

Kelley, Mitchell, Pushpakaran, Bejoy, Bayne, Stephen
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Year:
2016
Language:
english
Journal:
IEEE Transactions on Power Electronics
DOI:
10.1109/TPEL.2016.2621099
File:
PDF, 1.66 MB
english, 2016
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