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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II - Proposal for a source size and source position monitor for high power x-ray sources based on a "negative" pin-hole camera
Hau-Riege, Stefan P., Moeller, Stefan P., Yabashi, Makina, Jark, Werner H.Volume:
9210
Year:
2014
Language:
english
DOI:
10.1117/12.2062567
File:
PDF, 515 KB
english, 2014