![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Developments in X-Ray Tomography X - X-ray microtomography at Shanghai Synchrotron Radiation facility
Stock, Stuart R., Müller, Bert, Wang, Ge, Chen, Rongchang, Xie, Honglan, Deng, Biao, Du, Guohao, Ren, Yuqi, Wang, Yudan, Zhou, Guangzhao, Tan, Hai, Yang, Yiming, Xu, Liang, Hu, Tao, Li, Qiao, Feng, BiVolume:
9967
Year:
2016
Language:
english
DOI:
10.1117/12.2238785
File:
PDF, 2.67 MB
english, 2016