SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2016 - Beijing, China (Monday 9 May 2016)] Optical Measurement Technology and Instrumentation - Determining the nonlinear refractive index of fused quartz by femtosecond laser Z-scan technology
Zhang, Lin, Ren, Huan, Ma, Hua, Shi, Zhendong, Yang, Yi, Yuan, Quan, Feng, Xiaoxuan, Ma, Yurong, Chen, BoVolume:
10155
Year:
2016
Language:
english
DOI:
10.1117/12.2246627
File:
PDF, 596 KB
english, 2016