SPIE Proceedings [SPIE Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016) - Suzhou, China (Tuesday 26 April 2016)] 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment - Performance test and image correction of CMOS image sensor in radiation environment
Zhang, Yudong, Wu, Fan, Xu, Ming, To, Sandy, Wang, Congzheng, Hu, Song, Gao, Chunming, Feng, ChangVolume:
9684
Year:
2016
Language:
english
DOI:
10.1117/12.2243427
File:
PDF, 765 KB
english, 2016