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Atomic-scale characterization of subsurface damage and structural changes of single-crystal silicon carbide subjected to electrical discharge machining
Tan, Tsong-Han, Yan, JiwangVolume:
123
Language:
english
Journal:
Acta Materialia
DOI:
10.1016/j.actamat.2016.10.045
Date:
January, 2017
File:
PDF, 4.21 MB
english, 2017