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[IEEE 2016 Euromicro Conference on Digital System Design (DSD) - Limassol, Cyprus (2016.8.31-2016.9.2)] 2016 Euromicro Conference on Digital System Design (DSD) - Testability Based Metric for Hardware Trojan Vulnerability Assessment
Saha, Sayandeep, Chakraborty, Rajat Subhra, Mukhopadhyay, DebdeepYear:
2016
Language:
english
DOI:
10.1109/DSD.2016.17
File:
PDF, 263 KB
english, 2016