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[IEEE 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Sant Feliu de Guixols, Spain (2016.7.4-2016.7.6)] 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process
Tscherkaschin, Konstantin, Hillebrand, Theodor, Taddiken, Maike, Paul, Steffen, Peters-Drolshagen, DagmarYear:
2016
Language:
english
DOI:
10.1109/IOLTS.2016.7604683
File:
PDF, 605 KB
english, 2016