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SPIE Proceedings [SPIE Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016) - Suzhou, China (Tuesday 26 April 2016)] 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment - Stochastic dual-plane on-axis digital holography based on Mach–Zehnder interferometer
Zhang, Yudong, Wu, Fan, Xu, Ming, To, Sandy, Wang, Fengpeng, Wang, Dayong, Rong, Lu, Wang, Yunxin, Zhao, JieVolume:
9684
Year:
2016
Language:
english
DOI:
10.1117/12.2245141
File:
PDF, 2.54 MB
english, 2016