The microstructure, leakage current and dielectric behaviors of (Nd,Ti)-codoped BiFeO3thin films: effect of deposited substrate
Yang, C. H., Lv, P. P., Song, J. H., Leng, J. F., Sun, X. S.Volume:
28
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-016-5939-6
Date:
February, 2017
File:
PDF, 1.21 MB
english, 2017