Structural sensitivity of x-ray Bragg projection ptychography to domain patterns in epitaxial thin films
Hruszkewycz, S. O., Zhang, Q., Holt, M. V., Highland, M. J., Evans, P. G., Fuoss, P. H.Volume:
94
Language:
english
Journal:
Physical Review A
DOI:
10.1103/PhysRevA.94.043803
Date:
October, 2016
File:
PDF, 1.31 MB
english, 2016