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[IEEE 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Storrs, CT, USA (2016.9.19-2016.9.20)] 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Fault-aware sensitivity analysis for probabilistic real-time systems
Santinelli, Luca, Guo, Zhishan, George, LaurentYear:
2016
Language:
english
DOI:
10.1109/DFT.2016.7684072
File:
PDF, 823 KB
english, 2016