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[IEEE 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Sant Feliu de Guixols, Spain (2016.7.4-2016.7.6)] 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Online monitoring of NBTI and HCD in beta-multiplier circuits
Hillebrand, Theodor, Taddiken, Maike, Tscherkaschin, Konstantin, Paul, Steffen, Peters-Drolshagen, DagmarYear:
2016
Language:
english
DOI:
10.1109/IOLTS.2016.7604702
File:
PDF, 107 KB
english, 2016