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[IEEE 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2016.7.18-2016.7.21)] 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Understanding testing for dynamic fault isolation of microprocessors
Ravikumar, Venkat KrishnanYear:
2016
Language:
english
DOI:
10.1109/IPFA.2016.7564238
File:
PDF, 489 KB
english, 2016