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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Developments in X-Ray Tomography X - Automatic histology registration in application to x-ray modalities
Stock, Stuart R., Müller, Bert, Wang, Ge, Chicherova, Natalia, Hieber, Simone E., Schulz, Georg, Khimchenko, Anna, Bikis, Christos, Cattin, Philippe C., Müller, BertVolume:
9967
Year:
2016
Language:
english
DOI:
10.1117/12.2237322
File:
PDF, 994 KB
english, 2016