SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Wednesday 12 October 2016)] Nanophotonics and Micro/Nano Optics III - Inherent error in interferometric surface plasmon microscopy
Zhou, Zhiping, Wada, Kazumi, Zhang, Bei, Yan, Peng, Gao, Feng, Liu, Yu, Zhang, Qiancheng, Wang, LeVolume:
10027
Year:
2016
Language:
english
DOI:
10.1117/12.2246476
File:
PDF, 461 KB
english, 2016