Reliability Analysis of SSDs Under Power Fault

Reliability Analysis of SSDs Under Power Fault

Zheng, Mai, Tucek, Joseph, Qin, Feng, Lillibridge, Mark, Zhao, Bill W., Yang, Elizabeth S.
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Volume:
34
Language:
english
Journal:
ACM Transactions on Computer Systems
DOI:
10.1145/2992782
Date:
November, 2016
File:
PDF, 1.03 MB
english, 2016
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