[IEEE 2016 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE) - Vancouver, BC, Canada (2016.5.15-2016.5.18)] 2016 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE) - Feature selection to simplify BDI for efficient depression identification
Cai, Jiayue, Wang, Z. Jane, Appel-Cresswell, Silke, Mckeown, Martin J.Year:
2016
Language:
english
DOI:
10.1109/CCECE.2016.7726861
File:
PDF, 178 KB
english, 2016