[IEEE 2016 IEEE International Symposium on Defect and Fault...

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[IEEE 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Storrs, CT, USA (2016.9.19-2016.9.20)] 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Low cost resilient regular expression matching on FPGAs

Leipnitz, Marcos T., de Souza, Eduardo Nunes, Nazar, Gabriel L.
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Year:
2016
Language:
english
DOI:
10.1109/DFT.2016.7684073
File:
PDF, 591 KB
english, 2016
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