Experimental I-V(T) and C-V Analysis of Si Planar p-TFETs...

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Experimental I-V(T) and C-V Analysis of Si Planar p-TFETs on Ultrathin Body

Liu, Chang, Han, Qinghua, Glass, Stefan, Luong, Gia Vinh, Narimani, Keyvan, Tiedemann, Andreas T., Fox, Alfred, Yu, Wenjie, Wang, Xi, Mantl, Siegfried, Zhao, Qing-Tai
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Year:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2016.2619740
File:
PDF, 1.87 MB
english, 2016
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