Experimental I-V(T) and C-V Analysis of Si Planar p-TFETs on Ultrathin Body
Liu, Chang, Han, Qinghua, Glass, Stefan, Luong, Gia Vinh, Narimani, Keyvan, Tiedemann, Andreas T., Fox, Alfred, Yu, Wenjie, Wang, Xi, Mantl, Siegfried, Zhao, Qing-TaiYear:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2016.2619740
File:
PDF, 1.87 MB
english, 2016