[IEEE 2016 35th Chinese Control Conference (CCC) - Chengdu, China (2016.7.27-2016.7.29)] 2016 35th Chinese Control Conference (CCC) - Study on fault diagnostic strategy under unreliable test
Dong, Haidi, He, Bing, Liu, Gang, He, Huafeng, Qi, Haozhen, Ji, YiweiYear:
2016
Language:
english
DOI:
10.1109/chicc.2016.7554414
File:
PDF, 285 KB
english, 2016