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[IEEE 2016 IEEE/ACIS 15th International Conference on Computer and Information Science (ICIS) - Okayama, Japan (2016.6.26-2016.6.29)] 2016 IEEE/ACIS 15th International Conference on Computer and Information Science (ICIS) - Detection of design patterns from class diagram and sequence diagrams using ontology
Panich, Attawat, Vatanawood, WiwatYear:
2016
Language:
english
DOI:
10.1109/icis.2016.7550771
File:
PDF, 567 KB
english, 2016