Insight Into Electron Traps and Their Energy Distribution...

IEEE Transactions on Electron Devices 2016 / 9 Vol. 63; Iss. 9

Insight Into Electron Traps and Their Energy Distribution Under Positive Bias Temperature Stress and Hot Carrier Aging

Duan, Meng, Zhang, Jian Fu, Ji, Zhigang, Zhang, Wei Dong, Vigar, David, Asenov, Asen, Gerrer, Louis, Chandra, Vikas, Aitken, Rob, Kaczer, Ben
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Volume:
63
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2016.2590946
Date:
September, 2016
File:
PDF, 2.26 MB
english, 2016
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