SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2016 - Beijing, China (Monday 9 May 2016)] Optical Measurement Technology and Instrumentation - 3D shape reconstruction of specular surfaces by using phase measuring deflectometry
Zhou, Tian, Chen, Kun, Wei, Haoyun, Li, YanVolume:
10155
Year:
2016
Language:
english
DOI:
10.1117/12.2246164
File:
PDF, 640 KB
english, 2016