[ACM Press the 53rd Annual Design Automation Conference - Austin, Texas (2016.06.05-2016.06.09)] Proceedings of the 53rd Annual Design Automation Conference on - DAC '16 - Enabling sub-blocks erase management to boost the performance of 3D NAND flash memory
Chen, Tseng-Yi, Chang, Yuan-Hao, Ho, Chien-Chung, Chen, Shuo-HanYear:
2016
Language:
english
DOI:
10.1145/2897937.2898018
File:
PDF, 385 KB
english, 2016