[IEEE 2016 IEEE AUTOTESTCON - Anaheim, CA, USA (2016.9.12-2016.9.15)] 2016 IEEE AUTOTESTCON - Design of high precision analog modules and system architectures to maximize testability and long-term system reliability
Angelini, Brigid E., Cunningham, Andrew J., Goldfarb, Andrew M.Year:
2016
Language:
english
DOI:
10.1109/autest.2016.7589628
File:
PDF, 261 KB
english, 2016