[IEEE 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Storrs, CT, USA (2016.9.19-2016.9.20)] 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Side channel attacks on STTRAM and low-overhead countermeasures
Iyengar, Anirudh, Ghosh, Swaroop, Rathi, Nitin, Naeimi, HeliaYear:
2016
Language:
english
DOI:
10.1109/dft.2016.7684086
File:
PDF, 1.72 MB
english, 2016