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[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Long-term reliability of a hard-switched boost power processing unit utilizing SiC power MOSFETs
Ikpe, Stanley A., Lauenstein, Jean-Marie, Carr, Gregory A., Hunter, Don, Ludwig, Lawrence L., Wood, William, Iannello, Christopher J., Del Castillo, Linda Y., Fitzpatrick, Fred D., Mojarradi, MohammadYear:
2016
Language:
english
DOI:
10.1109/irps.2016.7574610
File:
PDF, 1.28 MB
english, 2016