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Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations
Gomez, A.F., Lavratti, F., Medeiros, G., Sartori, M., Poehls, L. Bolzani, Champac, V., Vargas, F.Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.10.012
Date:
October, 2016
File:
PDF, 1.46 MB
english, 2016