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Probing Long- and Short-Range Disorder in Y 2 Ti 2- x Hf x O7 by Diffraction and Spectroscopy Techniques
Zhang, Zhaoming, Avdeev, Maxim, de los Reyes, Massey, Lumpkin, Gregory R, Kennedy, Brendan J, Blanchard, Peter E.R., Liu, Samuel, Tadich, Anton, Cowie, Bruce C.C.Language:
english
Journal:
The Journal of Physical Chemistry C
DOI:
10.1021/acs.jpcc.6b07076
Date:
November, 2016
File:
PDF, 1.41 MB
english, 2016