Built-In Test and Diagnosis for TSVs with Different Placement Topologies and Crosstalk Impact Ranges
Hsu, Wen-Hsuan, Kochte, Michael A., Lee, Kuen-JongYear:
2016
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2016.2613928
File:
PDF, 2.08 MB
english, 2016