SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Interferometry XVI: Techniques and Analysis - 3D data processing with advanced computer graphics tools
Zhang, Song, Ekstrand, Laura, Grieve, Taylor, Eisenmann, David J., Chumbley, L. Scott, Schmit, Joanna, Creath, Katherine, Towers, Catherine E., Burke, JanVolume:
8493
Year:
2012
Language:
english
DOI:
10.1117/12.930376
File:
PDF, 1.85 MB
english, 2012