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[IEEE 2016 IEEE 21st International Conference on Emerging Technologies and Factory Automation (ETFA) - Berlin, Germany (2016.9.6-2016.9.9)] 2016 IEEE 21st International Conference on Emerging Technologies and Factory Automation (ETFA) - UAV degradation identification for pilot notification using machine learning techniques
Manukyan, Anush, Olivares-Mendez, Miguel A., Bissyande, Tegawende F., Voos, Holger, Le Traon, YvesYear:
2016
Language:
english
DOI:
10.1109/ETFA.2016.7733537
File:
PDF, 4.36 MB
english, 2016