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Ionizing Radiation Effects in 4H-SiC nMOSFETs Studied With Electrically Detected Magnetic Resonance
Waskiewicz, Ryan J., Anders, Mark A., Lenahan, Patrick M., Lelis, Aivars J.Year:
2016
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2016.2622159
File:
PDF, 451 KB
english, 2016