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Evaluation of $V_{ce}$ at Inflection Point for Monitoring Bond Wire Degradation in Discrete Packaged IGBTs
Singh, Arun, Anurag, Anup, Anand, SandeepYear:
2016
Language:
english
Journal:
IEEE Transactions on Power Electronics
DOI:
10.1109/TPEL.2016.2621757
File:
PDF, 3.85 MB
english, 2016