[IEEE 2016 International Conference on VLSI Systems, Architectures, Technology and Applications (VLSI-SATA) - Bengaluru, India (2016.1.10-2016.1.12)] 2016 International Conference on VLSI Systems, Architectures, Technology and Applications (VLSI-SATA) - Effect on temperature and time in parallel test scheduling with alterations in layers arrangements of 3D stacked SoCs

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