Fundamental aspects of electric double layer force-distance...

Scientific Reports 2016 / 9 Vol. 6

Fundamental aspects of electric double layer force-distance measurements at liquid-solid interfaces using atomic force microscopy

Black, Jennifer M., Zhu, Mengyang, Zhang, Pengfei, Unocic, Raymond R., Guo, Daqiang, Okatan, M. Baris, Dai, Sheng, Cummings, Peter T., Kalinin, Sergei V., Feng, Guang, Balke, Nina
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Volume:
6
Language:
english
Journal:
Scientific Reports
DOI:
10.1038/srep32389
Date:
September, 2016
File:
PDF, 1.63 MB
english, 2016
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