In situ optical characterizations of the...

Materials Research Express 2016 / 10 Vol. 3; Iss. 10

In situ optical characterizations of the annealing effects upon SnO 2 :F films by spectroscopic ellipsometry

Yuan, Guangzhong, Wang, Kangkai, Li, Ming, Gao, Qian, Liu, Yong, Jia, Shaohui, Song, Chenlu, Han, Gaorong
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Volume:
3
Language:
english
Journal:
Materials Research Express
DOI:
10.1088/2053-1591/3/10/105048
Date:
October, 2016
File:
PDF, 1.44 MB
english, 2016
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