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[IEEE 2016 IEEE 21st International Conference on Emerging Technologies and Factory Automation (ETFA) - Berlin, Germany (2016.9.6-2016.9.9)] 2016 IEEE 21st International Conference on Emerging Technologies and Factory Automation (ETFA) - Automated enhancement and detection of stripe defects in large circular weft knitted fabrics
Kopaczka, Marcin, Ham, Hanry, Simonis, Kristina, Kolk, Raphael, Merhof, DoritYear:
2016
Language:
english
DOI:
10.1109/ETFA.2016.7733678
File:
PDF, 6.57 MB
english, 2016