Analysis of the power outage effects in RFID

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IEEE Communications Letters 2016

Analysis of the power outage effects in RFID

Vales-Alonso, Javier, Munoz-Gea, Juan Pedro, Alcaraz, Juan J., Conzalez-Castano, F. J.
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Year:
2016
Language:
english
Journal:
IEEE Communications Letters
DOI:
10.1109/LCOMM.2016.2622258
File:
PDF, 129 KB
english, 2016
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