An Area Efficient Stacked Latch Design Tolerant to SEU in...

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IEEE Transactions on Nuclear Science 2016

An Area Efficient Stacked Latch Design Tolerant to SEU in 28 nm FDSOI Technology

Wang, Haibin B., Chen, Li, Liu, Rui, Li, Yuanqing, Kauppila, Jeffrey, Bhuva, Bharat, Lilja, Klas, Wen, Shi-Jie, Wong, Richard, Fung, Rita, Baeg, Sanghyeon
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Year:
2016
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2016.2627003
File:
PDF, 940 KB
english, 2016
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