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[IEEE 2016 12th World Congress on Intelligent Control and Automation (WCICA) - Guilin, China (2016.6.12-2016.6.15)] 2016 12th World Congress on Intelligent Control and Automation (WCICA) - Fault diagnosis method based on probability extended SDG and fault index
Liu, Ying-Jie, Meng, Qing-Hao, Zeng, Ming, Ma, Shu-GenYear:
2016
Language:
english
DOI:
10.1109/WCICA.2016.7578605
File:
PDF, 293 KB
english, 2016