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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Developments in X-Ray Tomography X - A new transmission x-ray microscope for in-situ nano-tomography at the APS (Conference Presentation)
Stock, Stuart R., Müller, Bert, Wang, Ge, De Andrade, Vincent, Deriy, Alex, Wojcik, Michael, Gürsoy, Doga, Shu, Deming, Mooney, Tim, Peterson, Kevin M., Glowacki, Arthur, Yue, Ke, Yang, Xiaogang, VescVolume:
9967
Year:
2016
Language:
english
DOI:
10.1117/12.2239449
File:
PDF, 120 KB
english, 2016