[ACM Press the 19th International Conference - Nashville, Tennessee (2015.07.20-2015.07.24)] Proceedings of the 19th International Conference on Software Product Line - SPLC '15 - Maintaining feature traceability with embedded annotations
Ji, Wenbin, Berger, Thorsten, Antkiewicz, Michal, Czarnecki, KrzysztofYear:
2015
Language:
english
DOI:
10.1145/2791060.2791107
File:
PDF, 973 KB
english, 2015