Positive Bias Temperature Instability and Hot Carrier...

Positive Bias Temperature Instability and Hot Carrier Injection of Back Gate Ultra-thin-body In 0.53 Ga 0.47 As-on-Insulator n-Channel Metal-Oxide-Semiconductor Field-Effect Transistor

Tang, Xiao-Yu, Lu, Ji-Wu, Zhang, Rui, Wu, Wang-Ran, Liu, Chang, Shi, Yi, Huang, Zi-Qian, Kong, Yue-Chan, Zhao, Yi
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Volume:
32
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/32/11/117302
Date:
November, 2015
File:
PDF, 955 KB
english, 2015
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