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[IEEE 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) - Shenzhen, China (2016.5.17-2016.5.21)] 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) - Fast modeling of conducted EMI phenomena using improved classical models
Fakhfakh, Leila, Alahdal, Abdulrahman, Ammous, AnisYear:
2016
Language:
english
DOI:
10.1109/apemc.2016.7522795
File:
PDF, 1.51 MB
english, 2016