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Radiation tolerance tests of SRAM-based FPGAs for the potential usage in the readout electronics for the LHCb experiment
Färber, C, Uwer, U, Wiedner, D, Leverington, B, Ekelhof, RVolume:
9
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/9/02/C02028
Date:
February, 2014
File:
PDF, 2.84 MB
english, 2014